Key Features
Keep track of every wafer
In semiconductor manufacturing, losing track of a single wafer can be costly. To avoid this, manufacturers need traceability systems that work every time, without fail.
The In-Sight 1740 series wafer readers automatically identify each wafer as it moves through the production process, ensuring 100% traceability. This eliminates guesswork, manual tracking, and expensive errors caused by mix-ups.
These compact, self-contained readers install easily into new or existing setups and deliver the reliable performance you need to keep production running smoothly.
Advanced features ensure complete traceability
12 built-in, software-controlled lighting modes handle any ID marks – from barely visible marks and ultra-thin coatings to sapphire substrates. As new wafer processes and coatings emerge, the In-Sight 1740 can adapt. Specialized lighting powered by its auxiliary light port ensures your operations stay future-proof.
Cognex code reading algorithms are built on expertise gained from over 30,000 wafer ID system installations around the world. These algorithms are reliable, robust, and capable of handling ID marks degraded by edge bead, CMP, scribe-on-die patterns, and other challenging conditions.
Wafer processing can degrade ID mark quality, making them hard to read for humans or machine vision. In-Sight 1740 readers overcome that challenge with automatic image enhancement filters. Even in extreme cases, these filters can transform a read failure into a success, improving reliability and eliminating the need for human intervention.
The In-Sight 1740 Series reads 40% faster than previous wafer ID readers. With this extra power, it can perform more processor-intensive image analysis and deliver exceptionally reliable results without increasing overall read times.
Ultimate simplicity and self-learning capabilities
Automatic optimization
The In-Sight 1740 series simplifies setup with its advanced tuning feature that automatically optimizes settings to read even the most challenging wafer marks – no advanced training required. With the ability to store up to 50 jobs in a single file, it handles mixed wafer lots with different identification mark characteristics.
Self-learning technology
Wafer marks can vary unpredictably from wafer to wafer or between lots. In-Sight 1740 Series addresses this with self-learning capabilities, dynamically adjusting lighting and image filters after a read failure. Successful optimizations are saved, allowing the system to adapt over time and eliminating the need for manual adjustments.
Complete read history logging
For enhanced traceability, the In-Sight 1740 Series can save detailed read results to a network log file. This includes the read string and read score, providing a comprehensive history for every reader in your facility.
Explore the full Cognex portfolio
Download the product guide or compare products to find the right solution for your application.
Specifications
In-Sight 1740 Wafer Reader Specifications
| In-Sight 1740 | Value |
|---|---|
| Image Resolution (MP) | 0.36 |
| Acquisition Speed (fps) | 41 |
| Light Type | Red LEDs (615-640nm) |
| In-Sight 1741 | Value |
|---|---|
| Image Resolution (MP) | 0.79 |
| Acquisition Speed (fps) | 17 |
| Light Type | Red LEDs (622nm) |
| In-Sight 1742 | Value |
|---|---|
| Image Resolution (MP) | 0.79 |
| Acquisition Speed (fps) | 17 |
| Light Type | IR LEDs (870-890nm) |
| In-Sight 1740 | Value |
|---|---|
| Discrete Inputs | None.(Eight inputs available when using the optional CIO-1400 I/Omodule.) |
| Discrete Outputs | None.(Six inputs available when using the optional CIO-1400 I/Omodule.) |
| Connectors | RJ45 Ethernet, "keyed" RJ45 PIO |
| Communication Protocols | Serial, NativeMode, LKx5, Electroglas, TELandTSK. |
| In-Sight 1741 | Value |
|---|---|
| Discrete Inputs | None.(Eight inputs available when using the optional CIO-1400 I/Omodule.) |
| Discrete Outputs | None.(Six inputs available when using the optional CIO-1400 I/Omodule.) |
| Connectors | RJ45 Ethernet, "keyed" RJ45 PIO |
| Communication Protocols | Serial, NativeMode, LKx5, Electroglas, TEL and TSK. |
| In-Sight 1742 | Value |
|---|---|
| Discrete Inputs | None.(Eight inputs available when using the optional CIO-1400 I/Omodule.) |
| Discrete Outputs | None.(Six inputs available when using the optional CIO-1400 I/Omodule.) |
| Connectors | RJ45 Ethernet, "keyed" RJ45 PIO |
| Communication Protocols | Serial, NativeMode, LKx5, Electroglas, TEL and TSK. |
| In-Sight 1740 | Value |
|---|---|
| Maximum Power Consumption (W) | 4.8 |
| In-Sight 1741 | Value |
|---|---|
| Maximum Power Consumption (W) | 4.8 |
| In-Sight 1742 | Value |
|---|---|
| Maximum Power Consumption (W) | 4.8 |
| In-Sight 1740 | Value |
|---|---|
| Maximum Operating Temperature (°C) | 113 |
| Minimum Operating Temperature (°C) | 0 |
| Materials | # |
| In-Sight 1741 | Value |
|---|---|
| Maximum Operating Temperature (°C) | 113 |
| Minimum Operating Temperature (°C) | 0 |
| Materials | # |
| In-Sight 1742 | Value |
|---|---|
| Maximum Operating Temperature (°C) | 113 |
| Minimum Operating Temperature (°C) | 0 |
| Materials | # |
| In-Sight 1740 | Value |
|---|---|
| Certifications | CE, FCC, KCC, TÜV SÜD NRTL, RoHS, IEC60825-1/A2:2001, EN60825-1/A1:2002, CAN/CSA-E60825-1:2003, SEMI S2-0709 |
| In-Sight 1741 | Value |
|---|---|
| Certifications | CE,FCC,KCC,TÜVSÜDNRTL,RoHS,IEC60825-1/A2:2001,EN60825-1/A1:2002,CAN/CSA-E60825-1:2003,SEMI S2-0709 |
| In-Sight 1742 | Value |
|---|---|
| Certifications | CE, FCC, KCC, TÜV SÜD NRTL, RoHS, IEC60825-1/A2:2001, EN60825-1/A1:2002, CAN/CSA-E60825-1:2003, SEMI S2-0709 |
Support
Best-in-class technology and tailored guidance to easily plan, deploy, and expand any vision project
Our devices can see even the smallest details with unrivaled accuracy, every time. Our industry-leading support works the way you want, from self-service resources to a global network of experts.
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